10 results
Refitting an X-ray diffraction system for combined GIXRF and XRR measurements
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- Journal:
- Powder Diffraction / Volume 35 / Issue S1 / December 2020
- Published online by Cambridge University Press:
- 01 July 2020, pp. S29-S33
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Secondary excitation process for quantitative confocal 3D-XRF analysis
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- Journal:
- Powder Diffraction / Volume 30 / Issue 2 / June 2015
- Published online by Cambridge University Press:
- 12 May 2015, pp. 109-112
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Recent Developments in Txrf of Light Elements
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 771-779
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- 1995
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Txrf-Sources-Samples and Detectors
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 755-766
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- 1995
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Total Reflection Xrf of Light Elements Using Various Excitation Sources
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- Journal:
- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 577-583
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- 1993
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TXRF with Various Excitation Sources
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 925-931
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- 1991
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Light Element Analysis with TXRF
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 947-952
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- 1991
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Recent Developments and Results in Total Reflection X-ray Fluorescence Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 1-12
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- 1990
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TXRF Spectrometer for Trace Element Detection
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- Journal:
- Advances in X-ray Analysis / Volume 33 / 1989
- Published online by Cambridge University Press:
- 06 March 2019, pp. 581-583
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- 1989
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Low Level Iodine Detection by TXRF in a Reactor Safety Simulation Experiment
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- Journal:
- Advances in X-ray Analysis / Volume 30 / 1986
- Published online by Cambridge University Press:
- 06 March 2019, pp. 85-88
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- 1986
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